Nguyen, N.
, Pellegrino, J.
, Amirtharaj, P.
, Seiler, D.
and Qadri, S.
(1993),
Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry, Journal of Applied Physics
(Accessed April 25, 2024)
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Interface Roughness of Short-Period AlAs/GaAs Superlattices Studied by Spectroscopic Ellipsometry
Published
Author(s)
, Joseph G. Pellegrino, , , S. B. Qadri
Citation
Journal of Applied Physics
Volume
73
Issue
11
Pub Type
Journals
Citation
Created May 31, 1993, Updated October 12, 2021