We have performed regular spectral transmittance and reflectance measurements over the 1 mm to 2.5 mm wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based monochromators and InGaAs photovoltaic detectors. The beam at the sample position is nearly collimated. The other system uses an FTIR (Fourier-Transform Infrared) spectrophotometer as a source and a diffuse Au-coated integrating sphere with a photoconductive HgCdTe detector. In this system, the sample is placed at the focus of an f/6 converging beam. Measurements are performed on transmissive materials as well as either highly reflective or absorptive mirrors and the results are compared, taking into account any differences in beam geometry and polarization among the different systems.
Proceedings Title: Optical Diagnostic Methods for Inorganic Materials, Conference | 2nd | Optical Diagnostic Methods for Inorganic Materials II | SPIE
Conference Dates: July 31-August 4, 2000
Conference Title: Proceedings of SPIE--the International Society for Optical Engineering
Pub Type: Conferences
Fourier-transform infrared spectrometer, infrared, reflectance, standard reference material, transmittance