A new uncertainty analysis is being performed for NIST's pulse parameter measurement service that represents the new pulse parameter measurement and extraction process. This new analysis is also expected to have lower uncertainties compared to those presently reported.
Proceedings Title: Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference
Conference Dates: November 30-December 1, 2000
Conference Location: Boulder, CO
Pub Type: Conferences
high-speed samplers, NIST measurement service, pulse parameters, sampling oscilloscopes, uncertainty analysis