This paper presents an analysis of long term memory effects on power measurements using diode power probes. It will be shown that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of Volterra Series, and then validated by simulations and measurements using a diode power probe.
Proceedings Title: 2010 IEEE MTT-S International Microwave Symposium Digest
Conference Dates: June 7-11, 2010
Conference Location: Anaheim, CA
Pub Type: Conferences
Diode Power Probe, Long-term Memory Effects, Nonlinear Device, Power Measurement