This chapter focuses on two atomic force microscopy (AFM) methods for nanomechanical characterization: force modulation microscopy (FMM) and contact resonance (CR) techniques. FMM and CR methods share several common features that distinguish them from other methods discussed in this book. Specifically, FMM and CR methods fall at the intersection of AFM methods that involve dynamic excitation and those that operate in continuous contact. Both of these characteristics present distinct measurement advantages. As a result, dynamic contact AFM methods enable more accurate, quantitative characterization of nanoscale mechanical properties.
Citation: Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization
Publisher Info: John Wiley and Sons, Hoboken, NJ
Pub Type: Books