We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port imperfections to differing degrees.
Citation: IEEE Transactions on Terahertz Science and Technology
Pub Type: Journals
Calibration, microwave, millimeter-wave, submillimeter wave, vector network analyzer