Characterization of a Low Thermal Scanner for Automatic Voltage Measurement with the NIST Josephson Voltage Standard

Published

January 2, 2007

Author(s)

Shiv K. Jaiswal, June E. Sims, Yi-hua D. Tang

Abstract

In order to increase the capacity of the NIST 10V Josephson Voltage Standard System for automatic calibration of Zener reference standards from the present 32 channels, a 64 channel low thermal scanner was procured. In the NIST JVS system, the scanner output lines are cross-connected to cancel the thermal emf of scanner channels. The new scanner has, therefore, been fully characterized in this mode to simulate the same measurement condition as in "NISTVolt" software used for automatic calibration of Zener reference standards. The results of this characterization show that thermal emfs of the scanner channels are well within the required 50 nV, and hence, it was put in use with the conventional NIST 10 V Josephson Voltage Standard system. The control charts of automatic calibrations of Zener reference standards using this new 64 channel scanner and the previous 32 channel scanner show that the trend of the data taken over several months follows the same trend line, and hence, the new scanner is taken to be verified and to be working satisfactorily.

Proceedings Title

Proceedings of Measurement Science Conference

Conference Dates

January 22-26, 2007

Conference Location

Long Beach, CA, USA

Conference Title

Measurement Science Conference

Pub Type

Conferences

Download Paper

Local Download

Keywords

Calibration, Josephson voltage standard, low thermal scanner, Zener reference standard

Citation

Jaiswal, S. , Sims, J. and Tang, Y. (2007), Characterization of a Low Thermal Scanner for Automatic Voltage Measurement with the NIST Josephson Voltage Standard, Proceedings of Measurement Science Conference, Long Beach, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32563 (Accessed April 19, 2024)