Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning fork-type sensors. The method eliminates uncertainties due to tip location, provides for direct calibration in ambient, liquid, ultrahigh vacuum (UHV), and cryogenic environments, and offers a route to measurements potentially traceable to the International System of Units (SI). The spring constants obtained with the dynamic calibration method agree with a traceable measurement made using instrumented indentation .
Proceedings Title: Proceedings of the Workshop on SPM Standardization, NCAFM 2010
Conference Dates: August 2-6, 2010
Conference Location: Kanizawa, -1
Conference Title: NCAFM 2010
Pub Type: Conferences
atomic force microscopy, small mass, spring constant, calibration, nanotechnology