Yohan Yoon is a CNST/UMD Postdoctoral Researcher in the Energy Research Group. He received a B. S. in Materials Science and Engineering from Seoul National University, Korea, and a Ph.D. in Materials Science and Engineering from North Carolina State University. His doctoral work used deep level transient spectroscopy and various device lifetime measurements such as quasi-steady-state photo-conductance and resonance-coupled photoconductive decay to characterize defects in silicon solar cells. In the CNST, Yohan is working with Nikolai Zhitenev developing measurements of local electronic and optical properties in order to characterize photovoltaic materials with microscale and nanoscale spatial resolution.
- Deep level transient spectroscopy and minority carrier lifetime study on Ga-doped continuous Czochralski silicon, Y. Yoon, Y. Yan, N. P. Ostrom, J. Kim, and G. Rozgonyi, Applied Physics Letters 101, 222107 (2012).
- Effect of nickel contamination on high carrier lifetime n-type crystalline silicon, Y. Yoon, B. Paudyal, J. Kim, Y.-W. Ok, P. Kulshreshtha, S. Johnston, and G. Rozgonyi, Journal of Applied Physics 111, 033702 (2012).
- Microstructure and electrical properties of high power laser thermal annealing on inkjet-printed Ag films, Y. Yoon, S.-M. Yi, J.-R. Yim, J.-H. Lee, G. Rozgonyi, and Y.-C. Joo, Microelectronic Engineering 87, 2230–2233 (2010).