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Simon G. Kaplan (Fed)

Simon Kaplan's research interests include spectrophotometry and radiometry. He has worked on the characterization of optical materials and components in support of UV photolithography and infrared remote sensing applications. Currently he is the project leader for the Low background infrared (LBIR) facility for absolute detector-based irradiance and radiance calibrations in support of missile defense.

He was awarded a NIST Bronze Medal in 2013 for contributions to the calibration accuracy of NOAA infrared environmental satellites.

Research projects

Transfer radiometers and reference detectors

Infrared optical properties of materials and components

Publications

Index of refraction of germanium

Author(s)
John H. Burnett, Eric C. Benck, Simon G. Kaplan, Erik Stover, Adam Phenis
Measurements of the index of refraction of a sample of high-quality, single-crystal germanium using the minimum deviation refractometry method are presented for

Refractive index measurements of Ge

Author(s)
John H. Burnett, Simon G. Kaplan
A program has been started at NIST to make high-accuracy measurements of the infrared (IR) index properties of technologically important IR materials, in order

Infrared Optical Properties of Materials

Author(s)
Simon G. Kaplan, Leonard M. Hanssen, Raju V. Datla
This document describes the Fourier Transform Infrared Spectrophotometry (FTIS) Facility at the Sensor Science Division (SSD) of the National Institute of

Chapter 4: Fourier transform methods

Author(s)
Simon G. Kaplan, Manuel A. Quijada
Chapter 4 describes the use of Fourier Transform Spectrometers (FTS) for accurate spectrophotometry over a wide spectral range. After a brief exposition of the
Created October 9, 2019, Updated June 15, 2021