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Alireza R. Panna, I Fan Hu, Mattias Kruskopf, Dinesh K. Patel, Dean G. Jarrett, Chieh-I Liu, Shamith U. Payagala, Dipanjan Saha, David B. Newell, Chi-Te Liang, Randolph Elmquist, Albert Rigosi
As first recognized in 2010, epitaxial graphene on SiC(0001) provides a platform for quantized Hall resistance (QHR) metrology unmatched by other 2D structures
Alireza R. Panna, Mattias Kruskopf, Albert F. Rigosi, Martina Marzano, Dinesh K. Patel, Shamith U. Payagala, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist
Randolph E. Elmquist, Mattias Kruskopf, Dinesh K. Patel, I Fan Hu, Chieh-I Liu, Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett
Quantized Hall array resistance standards (QHARS) span values from 100 (ohm) to 1 M(ohm) and demonstrate precision approaching that of single devices. This
Takehiko Oe, Shamith U. Payagala, Dean G. Jarrett, Nobu-Hisa Kaneko
DC high resistance measurement capability has been evaluated using a NMIJ traveling dual source bridge between NIST and NMIJ. The NMIJ bridge determines the