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Norman A. Sanford (Fed)

Direct Research Experience 

  • Atom probe tomography (APT), including extreme ultraviolet APT
  • Photoconductivity and photoluminescence studies of GaN nanowires
  • X-ray diffraction studies of thin film GaN and InGaN; X-ray diffraction imaging of GaN and LiNbO3
  • Linear and nonlinear optical characterization of GaN, AlGaN, LiNbO3, and PPLN
  • Rare-earth-doped waveguide lasers in silicate glass, phosphate glass, LiNbO3, and LiTaO3
  • Integrated optical waveguides, modulators, polarization converters, SHG and sum-frequency devices, and photorefractive coupling in LiNbO3
  • Pump-probe magneto-optic studies of the ferromagnetic semiconductor CrCr2Se4

Professional Associations

  • Member, Optical Society of America (now Optica)
  • Associate Editor, IEEE Journal of Quantum Electronics (JQE) (1999-2006)
  • In collaboration with Guest Editors, co-organized JQE Special Issue on Photonic Crystals (July, 2002)
  • Guest Topical Editor, JQE Special Section on LiNbO3 optical technology (October, 1997)

Patents

Recent:

  • Norman A. Sanford, Ann Chiaramonti Debay, Brian P. Gorman, David R. Diercks “Hybrid extreme ultraviolet imaging spectrometer,” U.S. Patent Number 9899197; issued February, 2018
  • Norman A. Sanford, Ann Chiaramonti Debay, “Imaging spectrometer,” U.S. Patent number 10153144; issued December, 2018
  • Kristine A. Bertness, Norman A. Sanford, Pavel Kabos, Thomas M. Wallis, “Tip-mounted nanowire light source instrumentation,” U.S. Patent number: 8484756; issued July, 2013

Archive:

  • Sanford is first author or coauthor of 14 additional U.S. Patents

Awards

  • H.B. Huntington Award, Rensselaer Polytechnic Institute (1983)
  • Fellow, Optical Society of America (now Optica) (1996)
  • U.S. Department of Commerce Bronze Medal (1997) For development and transfer of a non-destructive method to map the uniformity of lithium niobate compatible with integrated optical manufacturing.
  • R&D Magazine Micro/Nano 25 Award (2006) for Gallium Nitride Nanowire Nanolights

Publications

Atom Probe Tomography Using an Extreme Ultraviolet Trigger Pulse

Author(s)
Benjamin Caplins, Ann Chiaramonti Debay, Jacob Garcia, Norman A. Sanford, Luis Miaja Avila
Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure
Created October 9, 2019, Updated April 17, 2023