Papa Amoah

Publications

Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge2Sb2Se5 thin films

February 15, 2022

Author(s)

Yaw S. Obeng, Nhan Van Nguyen, Papa Amoah, Jungjoon Ahn, Mikhail Shalaginov, Juejun Hu, Kathleen Richardson

Broadband dielectric spectroscopy (BDS) was used to study thin films of Ge2Sb2Se5 exposed to low fluence UV-irradiation that resulted in thermally reversible

Evaluating solder joint failures and solder joint reliability: A side-by-side comparison of Direct Current and Microwave Based Monitoring Techniques

August 23, 2021

Author(s)

Yaw S. Obeng, Papa Amoah

Historically, the evaluating solder joint failures and solder joint reliability have been done with DC methods using event detectors or data loggers for high

Broadband Microwave Signal Dissipation in Nanostructured Copper Oxide at Air/Film Interface

September 17, 2020

Author(s)

Yaw S. Obeng, Papa K. Amoah, Christopher E. Sunday, Jesus Perez, Uros Cvelbar, Martin Kosicek

Contactless broadband microwave spectroscopic technique (a.k.a., broadband dielectric spectroscopy (BDS)) enables the accurate operando analysis of the

Application of Broadband RF Metrology to Integrated Circuit Interconnect Reliability Analyses: Monitoring Copper Interconnect Corrosion in 3D-ICs

June 4, 2020

Author(s)

Papa Amoah, Jesus Perez, Yaw S. Obeng

In this paper, we describe the development, and application, of a suite of high-frequency electromagnetic wave (RF) based techniques to probe material and

Microwave Monitoring of Atmospheric Corrosion of Interconnects

December 28, 2018

Author(s)

Papa Amoah, Dmitry Veksler, Christopher E. Sunday, Stephane Moreau, David Bouchu, Yaw S. Obeng

Traditional metrology has been unable to adequately address the reliability needs of emerging integrated circuits at the nano scale; thus, new metrology and

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Papa Amoah (IntlAssoc)

Publications