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Lawrence Henry Friedman (Fed)

physicist

Research Interests

Modeling and Simulation:

  • Continuum, Multiscale and Stochastic methods
  • Stress and Strain in Nanostructures and Nanostructured Materials
  • Electron Diffraction

Areas of Application:

  • Nanomechanical Standards for Atomic Force Microscopy
  • Nanoindentation and Nanomechanical Measurement
  • Dimensional measurement of nano-patterned arrays

Publications

Microscale Mapping of Structure and Stress in Barium Titanate

Author(s)
Jane A. Howell, Mark D. Vaudin, Lawrence H. Friedman, Robert F. Cook
Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium

Patents

Presentation of technologies with similar applications as Electron Relectometry

Electron Reflectometer and Process for Performing Shape Metrology

NIST Inventors
Lawrence Henry Friedman and Wen-Li Wu
Patent Description It has been discovered that an electron reflectometer and process for performing shape metrology provide electron reflectometry (ER) for measurement or determination of nanoscale dimensions in three dimensions at a surface with small-angle electron reflection. According to Fresnel
Created October 9, 2019, Updated June 15, 2021