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Lawrence Henry Friedman


Research Interests

Modeling and Simulation:

  • Continuum, Multiscale and Stochastic methods
  • Stress and Strain in Nanostructures and Nanostructured Materials
  • Electron Diffraction

Areas of Application:

  • Nanomechanical Standards for Atomic Force Microscopy
  • Nanoindentation and Nanomechanical Measurement
  • Dimensional measurement of nano-patterned arrays


Strain Measurement of 3D Structured Nanodevices by EBSD

William A. Osborn, Lawrence H. Friedman, Mark D. Vaudin
We present a new methodology to accurately measure strain magnitudes from 3D nanodevices using Electron Backscatter Diffraction (EBSD). Because the dimensions

Stochastic behavior of nanoscale dielectric wall buckling

Lawrence H. Friedman, Igor Levin, Robert F. Cook
The random buckling patterns of nanoscale dielectric walls are analyzed using a nonlinear multi-scale stochastic method that combines experimental measurements
Created October 9, 2019