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Lawrence Henry Friedman


Research Interests

Modeling and Simulation:

  • Continuum, Multiscale and Stochastic methods
  • Stress and Strain in Nanostructures and Nanostructured Materials
  • Electron Diffraction

Areas of Application:

  • Nanomechanical Standards for Atomic Force Microscopy
  • Nanoindentation and Nanomechanical Measurement
  • Dimensional measurement of nano-patterned arrays


Microscale Mapping of Structure and Stress in Barium Titanate

Jane A. Howell, Mark D. Vaudin, Lawrence H. Friedman, Robert F. Cook
Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium

Strain Measurement of 3D Structured Nanodevices by EBSD

William A. Osborn, Lawrence H. Friedman, Mark D. Vaudin
We present a new methodology to accurately measure strain magnitudes from 3D nanodevices using Electron Backscatter Diffraction (EBSD). Because the dimensions
Created October 9, 2019