Kristof Toth (Fed)

Kristof Toth is an NRC Postdoctoral Research Fellow working with Dr. Dean M. DeLongchamp in the Polymers Processing Group. His current research seeks to further develop resonant soft X-ray scattering (RSoXS), which is a powerful synchrotron-based tool for chemically specific structure characterization and molecular orientation measurements. He is also interested in leveraging unsupervised machine learning techniques to deconvolute scattering measurements in multicomponent systems.

Kristof completed his Ph.D. in Chemical Engineering at Yale University under the mentorship of Prof. Chinedum O. Osuji. He studied the self-assembly of block copolymer thin films, compositionally blended polymer systems, metal oxide nanorod growth, and liquid crystals using a variety of microscopy (SEM, TEM, AFM) and scattering techniques (SAXS, WAXS, GISAXS). He has been a co-Principal Investigator for the characterization of electrosprayed polymer thin films by in situ X-ray scattering at the National Synchrotron Light Source II, Brookhaven National Laboratory (BNL). In addition, Kristof designed and commissioned a first-of-its-kind user tool at the Center for Functional Nanomaterials at BNL with the ability to create compositionally gradient nanoscale films for high-throughput analysis.

ResearchGate

National Research Council Postdoctoral Fellowship, 2021-2023

National Science Foundation INTERN Funding Opportunity, 2019

National Science Foundation Graduate Research Fellowship, 2015-2019