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Jon Geist

Publications

Subnanometer localization accuracy in widefield optical microscopy

Author(s)
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

Author(s)
Craig R. Copeland, Craig D. McGray, Jon C. Geist, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of
Created October 9, 2019