Jon Geist

Publications

Particle tracking of microelectromechanical system performance and reliability

October 25, 2018

Author(s):

Craig R. Copeland, Craig D. McGray, Jon C. Geist, Samuel M. Stavis

Microelectromechanical systems (MEMS) that require contact of moving parts to implement complex functions have demonstrated critical limits of performance and...

Subnanometer localization accuracy in widefield optical microscopy

July 11, 2018

Author(s):

Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis

The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical...

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

September 28, 2017

Author(s):

Craig R. Copeland, Craig D. McGray, Jon C. Geist, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis

We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of...

Gravity-based characterization of three-axis MEMS-accelerometers in terms of intrinsic accelerometer parameters

July 13, 2017

Author(s):

Jon C. Geist, Muhammad Y. Afridi, Craig McGray, Michael Gaitan

Cross-sensitivity matrices are used to translate the response of three-axis accelerometers into components of acceleration along the axes of a specified...

ANALYSYS AND PROTOCOL FOR CHARACTERIZING INTRINSIC PROPERTIES OF THREE-AXIS MEMS ACCELEROMETERS USING A GIMBAL ROTATED IN THE GRAVITATIONAL FIELD

May 30, 2017

Author(s):

Michael Gaitan, Muhammad Y. Afridi, Jon C. Geist

Three-axis MEMS accelerometers are typically characterized in terms of their cross-sensitivity matrix. We present an analysis and protocol to characterize them...