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Jolene D. Splett (Assoc)

Jolene Splett graduated from the University of Wyoming at Laramie in 1986 with a Bachelor of Science degree in mathematics and statistics, and with a Master of Science degree in statistics in 1988.

Jolene has been with NIST's Statistical Engineering Division since 1988, except for part of 1995-98, when she was a marketing analyst for Colwell Systems, Inc., in Mendota Heights, Minnesota, and a statistician for the National Marrow Donor Program in Minneapolis, Minnesota.

Technical Areas of Research and Consulting:

  • Linear and nonlinear regression modeling
  • Experiment design
  • Uncertainty analysis
  • Statistical software

Professional Activities and Societies and Standards Activities:

  • Association for the Advancement of Medical Instrumentation 
  • Natrella Scholarship Selection Committee


  • Department of Commerce Bronze Medal Award (2020)
  • Allen V. Astin Measurement Science Award (2020)
  • Department of Commerce Silver Medal Award (2014)
  • NIST Safety Award (2010)
  • Measurement Services Award (1994)


Characterizing LTE User Equipment Emissions Under Closed-Loop Power Control

Jason Coder, Aric Sanders, Michael R. Frey, Adam Wunderlich, Azizollah Kord, Jolene Splett, Lucas N. Koepke, Daniel Kuester, Duncan McGillivray, John M. Ladbury
This report presents a laboratory-based characterization of Long Term Evolution (LTE) User Equipment (UE) emissions under closed-loop power control, building on

Calibration of free-space and fiber-coupled single-photon detectors

Thomas Gerrits, Alan L. Migdall, Joshua C. Bienfang, John H. Lehman, Sae Woo Nam, Oliver T. Slattery, Jolene D. Splett, Igor Vayshenker, Chih-Ming Wang
We present our measurements of the detection efficiency of free-space and fiber-coupled single- photon detectors at wavelengths near 851 nm and 1533.6 nm. We
Created October 9, 2019, Updated October 24, 2022