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Jolene D. Splett

Jolene Splett graduated from the University of Wyoming at Laramie in 1986 with a Bachelor of Science degree in mathematics and statistics, and with a Master of Science degree in statistics in 1988.

Jolene has been with NIST's Statistical Engineering Division since 1988, except for part of 1995-98, when she was a marketing analyst for Colwell Systems, Inc., in Mendota Heights, Minnesota, and a statistician for the National Marrow Donor Program in Minneapolis, Minnesota.

Technical Areas of Research and Consulting:

  • Linear and nonlinear regression modeling
  • Experiment design
  • Uncertainty analysis
  • Statistical software

Professional Activities and Societies and Standards Activities:


  • Department of Commerce Silver Medal Award (2014)
  • NIST Safety Award (2010)
  • Measurement Services Award (1994)


Microwave radiometer instability due to infrequent calibration

Kevin J. Coakley, Jolene D. Splett, Dave K. Walker, Mustafa Aksoy, Paul E. Racette
We directly quantify the effect of infrequent calibration on the stability of microwave radiometer temperature measurements (where a power measurement for the

Characterizing LTE User Equipment Emissions: Factor Screening

Jason B. Coder, Adam J. Wunderlich, Michael R. Frey, Paul Blanchard, Daniel G. Kuester, Azizollah Kord, Max Lees, Aric W. Sanders, Jolene D. Splett, Lucas N. Koepke, Robert D. Horansky, Duncan A. McGillivray, John M. Ladbury, Jeffrey T. Correia, Venkatesh Ramaswamy, Jerediah Fevold, Shawn Lefebre, Jacob K. Johnson, John Carpenter, Mark Lofquist, Keith Hartley, Melissa M. Midzor
Characterizations of long-term evolution (LTE) user equipment (UE) emissions are a key ingredient in models of interference between wireless cellular networks
Created October 9, 2019, Updated February 7, 2020