Dongheon Ha is a UMD Postdoctoral Researcher in the Nanoscale Processes and Measurements Group. He graduated with an Honors B.S. degree in Computer Science and Electrical Engineering (double degree) from Handong University, Korea. He received his M.S. in Electrical Engineering from Korea Advanced Institute of Science and Technology (KAIST), Korea, and a Ph.D. in Electrical Engineering from the University of Maryland. His doctoral research focused on developing novel anti-reflection coatings for photovoltaics. Dongheon is working with Dr. Nikolai Zhitenev developing new nanoscale measurement techniques to study defects in photovoltaic materials.