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Dongheon Ha

Dongheon Ha is a UMD Postdoctoral Researcher in the Nanoscale Processes and Measurements Group. He graduated with an Honors B.S. degree in Computer Science and Electrical Engineering (double degree) from Handong University, Korea. He received his M.S. in Electrical Engineering from Korea Advanced Institute of Science and Technology (KAIST), Korea, and a Ph.D. in Electrical Engineering from the University of Maryland. His doctoral research focused on developing novel anti-reflection coatings for photovoltaics. Dongheon is working with Dr. Nikolai Zhitenev developing new nanoscale measurement techniques to study defects in photovoltaic materials.

Selected Publications

  • Demonstration of resonance coupling in scalable dielectric microresonator coatings for photovoltaics, D. Ha, C. Gong, M. S. Leite and J. N. Munday, ACS Applied Materials and Interfaces 8, 24536-24542 (2016) (Cover).
  • Advanced broadband antireflection coatings based on cellulose micro-fiber paper, D. Ha, J. Murray, Z. Fang, L. Hu, and J. N. Munday, IEEE Journal of Photovoltaics 5, 577-583 (2015).
  • Paper-based anti-reflection coatings for photovoltaics, D. Ha, Z. Fang, L. Hu, and J. N. Munday, Advanced Energy Materials 4, 1301804 (2014) (Inside Cover).


Created September 26, 2019, Updated October 9, 2019