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Craig McGray

Dr. McGray is a contractor in the Nanoscale Metrology Group in the Engineering Physics Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He serves as an expert on micro-electromechanical systems (MEMS) and fabrication of micro- and nano-scale structures. He founded and leads NIST's microrobotics competition series, and works on the development of standards and measurements for existing and emerging components of the "Small Tech" industry. He received his Ph.D. from Dartmouth in 2005.

Publications

Subnanometer localization accuracy in widefield optical microscopy

Author(s)
Craig R. Copeland, Jon C. Geist, Craig D. McGray, Vladimir A. Aksyuk, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
The common assumption that precision is the limit of accuracy in localization microscopy and the typical absence of comprehensive calibration of optical

Aperture Arrays for Subnanometer Calibration of Optical Microscopes

Author(s)
Craig R. Copeland, Craig D. McGray, Jon C. Geist, James A. Liddle, Bojan R. Ilic, Samuel M. Stavis
We fabricate and test subresolution aperture arrays as calibration devices for optical localization microscopy. An array pitch with a relative uncertainty of

Centroid and Orientation Precision of Localization Microscopy

Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid
Created August 15, 2019