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Chih-Ming (Jack) Wang (Assoc)

Jack Wang was born in Taipei, Taiwan. He received a Ph.D. degree in Statistics from Colorado State University, in 1978. Between 1979 and 1984 he worked for SPSS, Inc., in Chicago, where he developed, programmed, and documented statistical software for mainframe systems. From 1984 to 1988 he worked for the General Motors Research Laboratories in Warren, Michigan, where he collaborated with engineers and computer scientists on various automobile-related projects. He has been with NIST in Boulder since 1988.

Jack's research interests include statistical metrology and the application of statistical methods to physical sciences. Current research focuses on developing statistical methods for analyzing high-speed optoelectronic measurements.

Technical Areas of Research and Consulting:

  • Interval estimation on variance components
  • Statistical graphics and computing
  • Application of statistical methods to physical sciences

Professional Activities and Societies and Standards Activities:

Awards:

  • U.S. Department of Commerce Silver Medal (2014) 
  • Outstanding Authorship Award, Information Technology Laboratory, NIST (2013) 
  • Allen V. Astin Measurement Science Award, NIST (2009)
  • W. J. Youden Award, American Statistical Association (2005)
  • Special Recognition Award, NCSL International (2001)
  • U.S. Department of Commerce Bronze Medal (1998)
  • James L. Madison Memorial Award, Colorado State University (1977)

Publications

Calibration of free-space and fiber-coupled single-photon detectors

Author(s)
Thomas Gerrits, Alan L. Migdall, Joshua C. Bienfang, John H. Lehman, Sae Woo Nam, Oliver T. Slattery, Jolene D. Splett, Igor Vayshenker, Chih-Ming Wang
We present our measurements of the detection efficiency of free-space and fiber-coupled single- photon detectors at wavelengths near 851 nm and 1533.6 nm. We

Calibration of free-space and fiber-coupled single-photon detectors

Author(s)
Thomas Gerrits, Alan L. Migdall, Joshua C. Bienfang, John H. Lehman, Sae Woo Nam, Jolene D. Splett, Igor Vayshenker, Chih-Ming Wang
We measure the detection efficiency of single-photon detectors at wavelengths near 851 nm and 1533.6 nm. We investigate the spatial uniformity of one free-space
Created October 9, 2019, Updated June 15, 2021