In this paper, a method of correcting both random and systematic timebase errors using measurements of only two quadrature sinusoids made simultaneously with a waveform of interest is described. The authors estimate the fundamental limits to the procedure due to additive noise and sampler jitter and demonstrate the procedure with some actual measurements.
Citation: IEEE Transactions on Microwave Theory and Techniques
Pub Type: Journals
comb generator, jitter, sampling oscilloscope, time-base distortion, waveform metrology