Kim, J.
, Seiler, D.
and Tseng, W.
(1993),
Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements, Journal of Applied Physics
(Accessed April 24, 2024)
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Multicarrier Characterization Method for Extracting Mobilities and Carrier Densities of Semiconductors from Variable Magnetic Field Measurements
Published
Author(s)
, , W. F. Tseng
Citation
Journal of Applied Physics
Volume
73
Issue
12
Pub Type
Journals
Citation
Created June 14, 1993, Updated October 12, 2021