van Roggen, A.
, Yuwono, L.
, Zhou, H.
, Meijer, P.
and Kopanski, J.
(1990),
Permittivity Measurements on Molecular-Sized Samples, Extended Abstract, Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Pocono Manor, PA, USA
(Accessed April 19, 2024)
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Permittivity Measurements on Molecular-Sized Samples, Extended Abstract
Published
Author(s)
A. van Roggen, L. Yuwono, , ,
Proceedings Title
Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP)
Conference Dates
October 29-November 1, 1990
Conference Location
Pocono Manor, PA, USA
Pub Type
Conferences
Citation
Created November 30, 1990, Updated October 12, 2021