Swyt, D.
, Phillips, S.
and Palmateer, J.
(2001),
Some Developments at NIST on Traceability in Dimensional Measurements, Proceedings of SPIE, Recent Developments in Traceable Dimensional Measurements, Jennifer E. Decker, Nicholas Brown, Editors, Munich, GE
(Accessed April 19, 2024)
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Some Developments at NIST on Traceability in Dimensional Measurements
Published
Author(s)
, , J Palmateer
Abstract
This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI unit of length in dimensional measurements by manufacturers without recourse to an NM1 for dimensional calibrations.Proceedings Title
Proceedings of SPIE, Recent Developments in Traceable Dimensional Measurements, Jennifer E. Decker, Nicholas Brown, Editors
Volume
4401
Conference Dates
June 27-28, 2001
Conference Location
Munich, GE
Conference Title
Establishing Direct Traceability on the Shop Floor
Pub Type
Conferences
Keywords
calibration, dimensional measurement, SI unit of length, traceability
Citation
Created October 1, 2001, Updated February 19, 2017