This paper reports to the international community on recent developments in technical ;policies, programs, and capabilities at the U.S. National Institute of Standards and Technology (NIST) related to traceability in dimensional measurements. These developments include: formal NIST policies on traceability and assuring quality in the results of the measurements it delivers to customers in calibration and measurement certificates, and a program to support the achievement of traceability to the SI unit of length in dimensional measurements by manufacturers without recourse to an NM1 for dimensional calibrations.
Proceedings Title: Proceedings of SPIE, Recent Developments in Traceable Dimensional Measurements, Jennifer E. Decker, Nicholas Brown, Editors
Conference Dates: June 27-28, 2001
Conference Location: Munich, GE
Conference Title: Establishing Direct Traceability on the Shop Floor
Pub Type: Conferences
calibration, dimensional measurement, SI unit of length, traceability