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Correlated Photon Based Metrology Without Absolute Standards
Published
Author(s)
Alan L. Migdall
Abstract
Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.
Migdall, A.
(1999),
Correlated Photon Based Metrology Without Absolute Standards, Physics Today, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841318
(Accessed April 25, 2024)