Over the past decade and a half, the National Institute of Standards and Technology (NIST) has established measurement capabilities for the characterization of the spectral emittance of material samples in the infrared spectral range of 1 to 20 microns. These capabilities are available to both internal and external customers. These capabilities are part of the Infrared Optical Properties Measurement Program and are located at the Fourier Transform Infrared Spectrophotometry (FTIS) Facility at NIST. Instrumentation has been developed for the characterization of sample emittance as a function of wavelength, temperature and angle. Both direct and indirect techniques of determining emittance are employed: an integrating sphere based method for samples at temperatures below 200 C and a radiance comparison method for temperatures up to 1000 C. The measurement systems and methods, as well as examples of sample emissivity results, including Pt10%Rh and SiC are reported.
Proceedings Title: Proceedings of the International Thermal Conductivity Conference | 2007 |
Conference Dates: June 24-27, 2007
Conference Title: International Thermal Conductivity Conference
Pub Type: Conferences