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PUBLICATIONS

Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

Published

Author(s)

Xiaohong Gu, Mark R. VanLandingham, Michael J. Fasolka, Jonathan W. Martin, J Y. Jean, Tinh Nguyen
Conference Location
Myrtle Beach, SC
Conference Title
Proceedings of the 26th Annual Meeting of the Adhesion Society
Pub Type
Conferences

Download Paper

Local Download

Keywords

Atomic Force Microscopy (AFM), Combinatorial and THE Methods, Microscopy, Nanostructured Materials, humidity, relative humidity (RH)

Citation

Gu, X. , VanLandingham, M. , Fasolka, M. , Martin, J. , Jean, J. and Nguyen, T. (2003), Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity, Proceedings of the 26th Annual Meeting of the Adhesion Society, Myrtle Beach, SC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853857 (Accessed April 19, 2024)

Created December 31, 2002, Updated October 12, 2021