X-ray photoelectron spectroscopy (XPS) has emerged as a premier method by which to study the chemical bonding in solids. Owing to the conservation of energy between the incident photon and the ejected photoelectron, XPS has provided much direct and important information pertaining to the occupied electronic density of states for many materials. However, because XPS measures the transition probabilities between the initial, bound-state valence electrons and the final, plane-wave continuum-state photoelectrons, the technique does not render the density of occupied electronic states. Rather, it produces the density of these states modulated by the electronic transition-probability matrix elements.
Citation: NSLS Science Highlights
Pub Type: Journals
bound-state valence electrons, plane-wave continuum-state photoelectron, x-ray photoelectron spectroscopy (XPS)