Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Identity management standards for product life cycle of electronic parts

Published

Author(s)

YaShian Li-Baboud, Eric D. Simmon, Yaw S. Obeng

Abstract

The high profit opportunities, the diffused outsourcing of manufacturing and the structure of distribution networks make the electronics and its components susceptible to counterfeiting. Distinguishing the genuine article from counterfeit is increasingly challenging, and accurate product authentication will require efficient access to information. Central to this objective is the management of the information and tools needed for product authentication. It is imperative to have integrated information flow throughout the product life cycle, from conception to disposal, such that relevant data would be available to the necessary parties from manufacturers to end-users to customs and other law enforcement officers. In this presentation, we plan to discuss key concepts for managing such product authentication information, how information standards can contribute to the mitigation of counterfeiting risks, current and upcoming standardization efforts, standardization pitfalls to be aware of, as well as other potential standardization areas to facilitate product identity information sharing for mitigating counterfeiting risks in the product lifecycle of electronic parts.
Proceedings Title
Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts
Conference Dates
September 9-10, 2008
Conference Location
College Park, MD

Keywords

electronics product authentication, identity management standards, anti-counterfeiting

Citation

Li-Baboud, Y. , Simmon, E. and Obeng, Y. (2008), Identity management standards for product life cycle of electronic parts, Symposium on Avoiding, Detecting, and Preventing Counterfeit Electronic Parts, College Park, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33159 (Accessed March 28, 2024)
Created September 10, 2008, Updated February 17, 2017