In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both of which yield equivalent results.
Conference Dates: November 29-30, 2001
Conference Location: San Diego, CA
Conference Title: 58th Auto. RF Tech. Group Conference
Pub Type: Conferences
frequency-domain characterization, high-impedance probes, on-wafer measurement