We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Proceedings Title: Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference
Conference Dates: November 30-December 1, 2000
Conference Location: Boulder, CO
Pub Type: Conferences
netowrk analyzer, on-waver calibration, OSLT, SOLR, SOLT, TRL calibration