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PUBLICATIONS

Electrical Measurements for Electronic Interconnections at NIST

Published

Author(s)

Dylan Williams, Donald C. DeGroot

Abstract

The National Institute of Standards and Technology (NIST) operates a number of research projects to advance measurement science and technology for the microelectronic industry. Here we will summarize (1), report on one component of the NIST program, the fundamental electrical characterization of electronic interconnections through accurate measurement.
Proceedings Title
Proc., URSI General Assembly
Conference Dates
August 13-21, 1999
Conference Location
Toronto, 1, CA
Pub Type
Conferences

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Keywords

electronic packaging, interconnections, measurements, network analysis
Electrical / electromagnetic metrology

Citation

Williams, D. and DeGroot, D. (1999), Electrical Measurements for Electronic Interconnections at NIST, Proc., URSI General Assembly, Toronto, 1, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7260 (Accessed April 18, 2024)

Created July 31, 1999, Updated October 12, 2021