This paper describes the microwave scattering parameter (s-parameter) and power measurement services available at NIST. This includes what is measured in each of the services, the techniques used for both calibration of the systems and subsequent measurements, a description of the systems and standards used and look at the uncertainty considerations for the different measurements. In addition, the future directions we are taking for both s-parameters and power will be covered.
Conference Dates: September 5-7, 2007
Conference Location: Beijing, CH
Conference Title: Intl. Metrology and Measurements Conf.
Pub Type: Conferences
measurement services, microwave power, microwave scattering parameters