We describe an instrument for in situ monitoring of the magnetic moment of a thin film during deposition with sub-monolayer sensitivity. The instrument measures the magnetic torque on a film as it is being deposited onto a microcantilever excited near its mechanical resonance. Dynamic feedback is used to balance the magnetic torque by applying a mechanical force at the base of the cantilever.
Citation: Journal of Magnetism and Magnetic Materials
Pub Type: Journals
magnetization, thin films-thickness, torque magnetometry, vibrating sample magnetometer