Moreland, J.
, Harvey, T.
, Ono, R.
and Roshko, A.
(1993),
Scanned Probe Microscopy of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>x</sub> Thin-Film Device Structures on Si Substrates, IEEE Transactions on Applied Superconductivity
(Accessed April 25, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates
Published
Author(s)
, , ,
Citation
IEEE Transactions on Applied Superconductivity
Volume
3(1)
Pub Type
Journals
Citation
Created February 28, 1993, Updated October 12, 2021