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High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer

Published

Author(s)

Simon G. Kaplan, R Gupta
Citation
Journal of Research (NIST JRES) -
Volume
108

Citation

Kaplan, S. and Gupta, R. (2003), High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed March 28, 2024)
Created January 1, 2003, Updated February 17, 2017