A field emission scanning electron microscope was fitted with electron spin polarization analyzers in order to image submicron magnetic microstructures. Spin polarization analysis of the emitted secondary electrons provides a direct measurement of the magnitude and direction of the magnetization in the area probed by the incident electron beam. The polarization measurement is independent of topographic contrast which is measured simultaneously. The polarization was measured using a new type of analyzer which is very compact, simple, and at least as efficient as a Mott detector. The small detector size allowed the use of multiple orthogonal detectors so that all three components of the magnetization vector could be measured. This apparatus was used to examine the domain structure of various Fe-3% Si crystals.
Citation: Journal of Magnetism and Magnetic Materials
Pub Type: Journals