This paper describes the use of Scanning Electron Microscopy with Polarization Analysis to quantitatively image the magnetic structure of permalloy magnetic memory elements. Various methods of determining the absolute magnitude and direction of the magnetization vector are described. The magnetic domain structures are observed as a function of ion milling time. During ion milling the surface composition is monitored by Auger analysis.
Citation: IEEE Transactions on Magnetics
Pub Type: Journals