SEMPA provides a new and versatile means of imaging surface magnetic microstructure with high resolution. When a ferromagnetic sample is probed by the highly focussed electron beam of an SEM, secondary electrons are generated whose spin polarization is directly proportional to the magnetization in the region sampled by the beam. By measuring this spoin polarization, the direction and magnitude of the sample magnetization can be imaged with 10 nm spatial resolution. A review of the SEMPA technique and recent results will be presented.
Conference Dates: August 1, 1990
Conference Location: Pennington, NJ
Conference Title: Symposium on Magnetic Materials, Processes and Devices
Pub Type: Conferences