An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal. This paper focuses on comparing the results of various analog-to-digital converters (ADCs) used to evaluate the functional integrity of a biosensor. The objective of this research is to determine key issues associated with providing the metrology infrastructure needed for developing the design reuse approach for multi-technology Systems-on-a-Chip (SoC) devices.
Proceedings Title: Proc., Conference Proceedings - 2001 IEEE International Symposium on Circuits and Systems
Conference Dates: May 6-9, 2001
Conference Location: Sydney, AS
Pub Type: Conferences
BIST, ADC, oscillation, sensor, system-on-a-chip (SOC), mixed signal device