Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals

Published

Author(s)

David R. Black, Joseph C. Woicik, Martine Duff, Douglas Hunter, Arnold Burger, Michael Groza

Abstract

Synthetic CdZnTe or CZT crystals can be used for room temperature detection of ?-radiation. Structural/morphological heterogeneities within CZT, such as twinning, secondary phases (often referred to as inclusions or precipitates), and polycrystallinity can affect detector performance. As part of a broader study using synchrotron radiation techniques to correlate detector performance to microstructure, x-ray topography (XRT) has been used to characterize CZT crystals. We have found that CZT crystals almost always have a variety of residual surface damage. Specific structures are identifiable as resulting from fabrication processes and from handling and shipping of sample crystals. Etching was found to remove this damage; however, the detector performance of the etched surfaces was inferior to the as-polished surface due to higher surface currents which result in more peak tailing and less energy resolution.
Proceedings Title
Proceedings of the MRS Conference | Fall | 2007 |
Conference Dates
November 26-30, 2007
Conference Title
MRS Conference

Keywords

CdZnTe, detectors, surface damage, x-ray topography

Citation

Black, D. , Woicik, J. , Duff, M. , Hunter, D. , Burger, A. and Groza, M. (2008), X-Ray Topography to Characterize Surface Damage on CdZnTe Crystals, Proceedings of the MRS Conference | Fall | 2007 | (Accessed March 29, 2024)
Created January 7, 2008, Updated February 19, 2017