Splett, J.
and Wang, C.
(2005),
Uncertainty in Reference Values for the Charpy V-notch Verification Program, Journal of Testing and Evaluation, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50807
(Accessed April 23, 2024)
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Uncertainty in Reference Values for the Charpy V-notch Verification Program
Published
Author(s)
,
Abstract
We present a method for computing the combined standard uncertainty for reference values used in the Charpy machine verification program administered by the National Institute of Standards and Technology. The technique is compliant with the ISO GUM and models the between-machine bias using a Type B distribution. We demonstrate the method using actual data from the Charpy machine verification program.Citation
Journal of Testing and Evaluation
Volume
34 No 3
Pub Type
Journals
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Keywords
charpy v-notch, impact certification program, impact testing, ISO GUM, notched-bar testing, reference specimens, uncertainty
Citation
Created May 1, 2005, Updated February 19, 2017