A two day workshop on Texture in Electronic Applications was held on October 10-11,2000 at NIST, Gaithersburg. The workshop presented an excellent forum for discussion of a broad spectrum of texture-related issues of interest to academic,government and industrial participants The need for a thin film texture standard was expressed and an informal round robin corrdinated by NIST will be started this year as a first step in the standards development process. In addition, NIST will evaluate the broader need for a Guide to Practice on texture measurement by conventional diffractometers. The group decided to hold a symposium on Texture and Microstructure in Electronic and Magnetic Films for the Materials Research Society Spring 2002 meeting.
Citation: Journal of Research (NIST JRES) -
Volume: 106 No. 3
NIST Pub Series: Journal of Research (NIST JRES)
Pub Type: NIST Pubs
crystallographic texture, electronic applications, presentations, round table discussion, workshop