Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately characterized from external reflection coefficient measurements when a single bias-dependent active standard is embedded within it. The frequency characteristics, stability, and linearity of active PIN diode standards are investigated.
Proceedings Title: Tech Dig., Auto. RF Tech. Group Conf.
Conference Dates: November 29-30, 1990
Conference Location: Monterey, CA
Pub Type: Conferences