In this study, a well-controlled humidity system is used to enhance the sensitivity of A-FM in characterizing surface chemical heterogeneity. The relative humidity of the tip-sample environment is controlled using a humidity generator and a novel small-volume environmental chamber designed and fabricated. The relative humidity in the chamber can be controlled from nearly 0 % relative humidity (RH) up to 95 % RH at room temperature. The effects of relative humidity on AFM image contrast are studied using a patterned SAM sample and polymers withalternating regions of hydrophobic and hydrophilic materials. The results clearly demonstrate that the image contrast between the hydrophilic and hydrophobic regions of a surface is substantially increased by elevated relative humidity in the measurement environment.
Proceedings Title: Proceedings of the 26th Annual Meeting of the Adhesion Society
Conference Dates: February 23-26, 2003
Conference Title: Adhesion Society Meeting
Pub Type: Conferences
Atomic Force Microscopy (AFM), humidity, relative humidity (RH)