Sayan, S.
, Nguyen, N.
, Ehrstein, J.
, Emge, T.
, Garfunkel, E.
, Croft, M.
, Zhao, X.
, Vanderbilt, D.
, Levin, I.
, Gusev, E.
and Kim, H.
(2005),
Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon, Applied Physics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32146
(Accessed April 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Structural, Electronic, and Dielectric Properties of Ultrathin Zirconia Films on Silicon
Published
Author(s)
, , , Tom Emge, Eric Garfunkel, Mark Croft, X Zhao, David V. Vanderbilt, Ira Levin, Evgeni Gusev, Hyunjung G. Kim
Citation
Applied Physics Letters
Volume
86
Pub Type
Journals
Download Paper
Citation
Created November 17, 2005, Updated January 27, 2020