Scanning Electron Microscopy with Polarization Analysis (SEMPA) provides high resolution (10 nm) magnetization images simultaneously with, but independent of, the topography. Such information is very useful in studying spintronics devices as illustrated by three examples: 1) exchange coupling of magnetic layers, 2) spin-transfer switching in magnetic nanowires, and 3) the ferromagnetic metal-semiconductor interface.
Conference Dates: January 1, 2007
Conference Location: Gaithersburg, Maryland
Conference Title: Frontiers of Characterization and Metrology for Nanoelectronics 2007
Pub Type: Conferences
exchange coupling, nanomagnetism, spin polarization, spin reorientation, spin torque transfer, spintronics