This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying quantities. Results have been obtained for the effect due to uncertainties in the reflection coefficients of the input terminations, the noise temperature of the hot noise source, connector variability, the ambient temperature, and the measurement of the output noise. Representative results are presented for both uncorrelated and correlated uncertainties in the underlying quantities.
Conference Dates: June 2-7, 2002
Conference Location: Seattle, WA
Conference Title: Intl. Microwave Symp.
Pub Type: Conferences
amplifier noise parameters, measurement uncertainty, Monte Carlo simulation, noise measurement, thermal noise