Seiler, D.
, Diebold, A.
, McDonald, R.
, Chabli, A.
and Secula, E.
(2011),
Frontiers of Characterization and Metrology for Nanoelectronics: 2011, American Institute of Physics, Melville, NY
(Accessed April 19, 2024)
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Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Published
Author(s)
, Alain C. Diebold, Robert McDonald, Amal Chabli,
Citation
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Volume
1395
Publisher Info
American Institute of Physics, Melville, NY
Pub Type
Books
Citation
Created December 27, 2011, Updated October 12, 2021