Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Flat frequency response in the electronic measurement of the Boltzmann constant

Published

Author(s)

Jifeng Qu, Samuel Benz, Yang Fu, Jianqiang Zhang, Horst Rogalla, Alessio Pollarolo

Abstract

A new quantum voltage calibrated Johnson noise thermometer (JNT) was developed at NIM to demonstrate the electrical approach that determines the Boltzmann constant k by comparing electrical and thermal noise power. A measurement with integration period of 10 hours and bandwidth of 640 kHz results in relative offset of 0.5106 from the current CODATA value of k, and type A relative standard uncertainty of 23106. The quadratic fitting parameters of the ratio spectrum show a flat frequency response with respect to the measurement bandwidth. This flat response is a dramatic improvement compared to the response produced by the NIST JNT system that dominated the relative combined uncertainty of previous measurements of k.
Proceedings Title
Conference on Precision Electromagnetic Measurements Conference Digest
Volume
28
Conference Dates
July 1-6, 2012
Conference Location
National Harbor, MD, US
Conference Title
Conference on Precision Electromagnetic Measurements

Keywords

Boltzmann equation, Correlation, Digital-analog conversion, Josephson arrays, Measurement units, Noise Measurement, Quantization, Signal synthesis, Standards, Temperature

Citation

Qu, J. , Benz, S. , Fu, Y. , Zhang, J. , Rogalla, H. and Pollarolo, A. (2012), Flat frequency response in the electronic measurement of the Boltzmann constant, Conference on Precision Electromagnetic Measurements Conference Digest, National Harbor, MD, US, [online], https://doi.org/10.1109/CPEM.2012.6250879, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=910580 (Accessed April 24, 2024)
Created June 30, 2012, Updated October 12, 2021